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Volume 9, Issue 2
Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems

Xiaoping Fang, Youjun Deng & Xiaohong Chen

East Asian J. Appl. Math., 9 (2019), pp. 280-294.

Published online: 2019-03

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  • Abstract

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

  • AMS Subject Headings

35J05, 31B40, 35R30

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COPYRIGHT: © Global Science Press

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@Article{EAJAM-9-280, author = {}, title = {Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems}, journal = {East Asian Journal on Applied Mathematics}, year = {2019}, volume = {9}, number = {2}, pages = {280--294}, abstract = {

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

}, issn = {2079-7370}, doi = {https://doi.org/10.4208/eajam.030518.210918}, url = {http://global-sci.org/intro/article_detail/eajam/13083.html} }
TY - JOUR T1 - Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems JO - East Asian Journal on Applied Mathematics VL - 2 SP - 280 EP - 294 PY - 2019 DA - 2019/03 SN - 9 DO - http://doi.org/10.4208/eajam.030518.210918 UR - https://global-sci.org/intro/article_detail/eajam/13083.html KW - Electrical impedance tomography, small inclusion, inverse problem, uniqueness. AB -

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

Xiaoping Fang, Youjun Deng & Xiaohong Chen. (2019). Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems. East Asian Journal on Applied Mathematics. 9 (2). 280-294. doi:10.4208/eajam.030518.210918
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